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Run Time Test Diagram Generator
Product 9505: Run Time Diagram Generator
And / or
Product 9507: Run Time Diagram Viewer
Version 1.15.0
28 June 2001
1.1 Critical Items
None
1.2 Known Limitations
1.2.1 Run-Time Test Diagram Generator driver compatibility
The MATE CILL and CEM drivers are fully supported for test diagram generation. Due to the internal AIL code generation implementation the macro drivers are not supported. The simulated drivers are also supported allowing test diagram generation without driver implementation.
1.2.2 Dynamic Parameter Changer driver support
MATE CIIL or CEM device drivers are required to support dynamic parameter changing. Macro drivers are not supported due to the internal scheme of parameter passing to macros.
1.3 Enhancements
1.3.1 Path Highlighting
The path highlighting increases the readability of complex diagrams by changing the color of all connections, pins and switches physically connected together. The feature is toggled on / off by clicking on any pin part of the desired path.

1.3.2 Hardwired pins tooltip
The hardwired pins tooltip increases the readability of large diagrams by using a tooltip to display the hardwired pins. This information is especially useful when pins wired together are displayed on different pages and not visible simultaneously. The feature is activated as a standard tooltip; the mouse pointer has to be kept above the desired pin for more than 500 ms.
1.3.3 Dynamic Parameter Changer
The Dynamic Parameter Changer is a new major feature allowing not only to monitor the device states but to modify them too. The user can change the device parameters (ATLAS modifiers) by double-clicking the desired ATE resource in the ATE resource tree. The resource editor dialog box is then displayed allowing parameters editing. The requested changes are sent both to the RTS and the device drivers. The RTS in turn notifies the viewer to update the device state. See the help system for details.

1.4 Problem Reports
1.4.1 PR00-053 Static TDG Irregular Ports
Using the given testcase, the diagram on page 7 has irregularities - DMM-HI and DMM-LO appear multiple times in and around the same box.
The provided testcase works fine with the new RTDG. Since there is no support for macro drivers the macro code generation has to be disabled in order to show the actual states and connections.
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