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TYX TestBase

Evolution

   

The architecture and functionality of TYX TestBase are continuously enhanced, to accommodate emerging interface standards, new test technologies, new software technologies and new versions of third-party applications integrated with TestBase. Some recent functional additions are listed below (click the hyperlinks to navigate to a detailed description of each addition). To request additional information or a demonstration for any of these features, send an email to sales@tyx.com.

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Support for the "design-to-test" paradigm

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Support for embedded testing and diagnostics

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Support for signal-based, UUT-oriented testing

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Support for IEEE P1641 Standard for Signal and Test Definition


Support for the "design-to-test" paradigm

TestBase supports the import of test strategies generated by third-party diagnostic software, being currently integrated with DSI eXpress from DSI International and with Intusoft Test Designer. The integration between TestBase and eXpress is achieved through DiagML, a Diagnostic Modeling Language based on XML jointly developed by TYX and DSI.

The eXpress-TestBase integrated architecture supports the design-to-test paradigm, where test strategies are generated automatically from design data, while information feedback loops enable the use of test and diagnostic results to improve the product's design and the performance of diagnostics.

Download: "TYX TestBase - Design-To-Test Demonstration" (slides, PDF format, 178K)

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Support for embedded testing and diagnostics

TYX has developed an Embedded Diagnostic Controller (EDC) for TestBase, which is capable of executing test strategies developed with the TestBase IDE, but has lower resource requirements than the workstation-based TestBase Diagnostic Controller. The EDC has a portable core that can be re-compiled to accommodate various embedded operating systems. Having a modular, open architecture, the EDC is capable of interacting with vehicle control software and with third-party embedded diagnostics software. The TestBase Embedded Diagnostic Controller is currently available as a proof-of-concept prototype, operating under Embedded Windows XP.

In conjunction with a ground-based TestBase installation, the EDC supports the integrated development of diagnostics and integrated storage of results for embedded, production and maintenance environments.

Download: "Embedded Diagnostics with TestBase, TYX White Paper" (PDF format, 186K). This paper describes the expansion of TestBase into a third environment - the run time execution of test and diagnostics on embedded systems. With this new functionality, systems and system components can be constantly monitored and diagnosed in real-time, allowing mission commanders and operators an on-going view of the health of their systems.

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Support for signal-based, UUT-oriented testing

Signal-based, Unit Under Test (UUT)-oriented Test Program Sets (TPSs) specify the signals to be applied, measured and monitored at the pins of the UUT. Because they do not contain instrument-specific commands or station-specific switching paths, such TPSs are totally independent of the test station hardware. This feature is very important in application domains such as aerospace and weapon systems, where UUTs are maintained over long periods of time, often exceeding the lifetime of the test hardware and its controlling computer. Signal-based, UUT-oriented TPSs enable the replacement of obsolete hardware, or even a complete re-host on a different test station, without requiring extensive changes in the TPS code. In addition, these TPSs can be executed unchanged on various hardware configurations, available at different maintenance levels.

While the signal-based, UUT-orientation paradigm is the fundamental basis of the ATLAS language, it can also be implemented with other types of test software architecture. Building on the experience accumulated with ATLAS development tools, TYX is developing a Signal Object Library, which enables the development of signal-based, UUT-oriented test programs with general-purpose programming languages. The Signal Object Library is a component library implementing IEEE P1641 signals. The components are usable from any COM-compatible programming language. The execution of test programs that use the library is supported by a run-time engine that provides automatic resource allocation and switch path calculation services. The signal-oriented control of instruments and switches is achieved via IVI Signal Drivers. The TYX Signal Object Library is currently available as a proof-of-concept prototype.

TestBase enables the specification of signals as test procedure parameters, through specialized Custom Data Type Editors (see the next functional feature for an example). By combining this capability with the use of the Signal Object Library from general-purpose programming languages, TestBase enables the development of test strategies that are totally independent of the test station hardware, with the benefits described above. This represents the "next generation TPS", a modern alternative to ATLAS TPSs, using the valuable testing principles from ATLAS in conjunction with visual design and mainstream programming languages.

Download: "Instrument Interchangeability Demonstration" (PDF format, 667K). This presentation, developed by TYX for the IVI Foundation, shows how various levels of instrument independence can be achieved by using IVI Signal Drivers alone, or in conjunction with a signal library (e.g., the TYX Signal Object Library described above). While the presentation does not cover TestBase, it shows how the signal-based, UUT-orientation paradigm can be used to achieve instrument independence. For a presentation that includes TestBase, see the next functional feature.

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Support for IEEE P1641 Standard for Signal and Test Definition

IEEE P1641, the successor to the IEEE Std. 716-1995 ATLAS standard, specifies a formal mechanism for defining signals and an XML-based representation format. The new standard also includes a set of predefined signals, similar to the nouns defined by the 716-1995 ATLAS language subset.

TestBase enables the use of IEEE P1641 signals as test procedure parameters. This functionality is achieved through integration with the newWave application from Racal Instruments, via a Custom Data Type Editor and the XML-based signal specification format defined by P1641. The integration solution enables TestBase developers to specify test procedure parameters as signals, through the newWave graphical interface, and to verify these signals through simulation. The test procedure code has access to the XML representation of signals.

Download: "IEEE P1641 Implementation Architecture - Prototype Demonstration" (slides, PDF format, 484K)

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